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QNix 5500 Schichtdickenmessgerät

Safety by precision and trueness

For valid results in quality assurance

  • High measuring trueness over the entire range
  • High repeatability of measured results
  • Temperature compensation directly in the sensor

Robustness and resistance

For long and reliable use, even under harsh conditions

  • Fiberglass reinforced, 5 piece casing with IP65 dust and splash water protection
  • Three layer protection to absorb shocks
  • LCD glass providing resistance against scratches and chemicals (Level H6)
  • Stainless steel probe with dust protection membrane (IP65)

Time saving by ergonomics

Fast and fatigue proof work even with continuous use

  • Luminosity IPS-LCD, 2“, colour, 350 cd/m2, reading angle 70°
  • Automatic flip display 0°, 90°, 180°, 270°
  • Low centre of gravity with large contact surface for precise measuring

Flexibility and expandability

Future-proof by changeable probes

  • Gauge body suitable for Fe-, NFe- and dual-probes
  • Integrated probe and cable probe available in one device
  • Increased readiness for use by quick change of probes

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Safety by precision and trueness

For valid results in quality assurance

  • High measuring trueness over the entire range
  • High repeatability of measured results
  • Temperature compensation directly in the sensor

Robustness and resistance

For long and reliable use, even under harsh conditions

  • Fiberglass reinforced, 5 piece casing with IP65 dust and splash water protection
  • Three layer protection to absorb shocks
  • LCD glass providing resistance against scratches and chemicals (Level H6)
  • Stainless steel probe with dust protection membrane (IP65)

Time saving by ergonomics

Fast and fatigue proof work even with continuous use

  • Luminosity IPS-LCD, 2“, colour, 350 cd/m2, reading angle 70°
  • Automatic flip display 0°, 90°, 180°, 270°
  • Low centre of gravity with large contact surface for precise measuring

Flexibility and expandability

Future-proof by changeable probes

  • Gauge body suitable for Fe-, NFe- and dual-probes
  • Integrated probe and cable probe available in one device
  • Increased readiness for use by quick change of probes
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