Sondy skanujące 30 MHz do 3 GHz
  • Sondy skanujące 30 MHz do 3 GHz
  • Sondy skanujące 30 MHz do 3 GHz
  • Sondy skanujące 30 MHz do 3 GHz

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Hersteller: Langer EMV-Technik

Sondy skanujące 30 MHz do 3 GHz

  • RFS set
Kurze Beschreibung:

The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field.

The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request further LFS, RFS, XFS, and SXS scanner probes are available.

They are intended for frequency ranges from 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements necessary for proper localization of interference sources on the electronic assembly. They document the entire near-field image of the tested device. The scanner probes have shielded current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistor. The measurement signal can be amplified using the PA 203 or PA 303 preamplifier. Further scanner probes LFS, RFS, XFS, and SXS are available on request.

Technical Specifications

Frequency Range 30 MHz ... 3 GHz
Connector SMA, male, socket
Weniger
Weiterlesen

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The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request further LFS, RFS, XFS, and SXS scanner probes are available.

They are intended for frequency ranges from 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements necessary for proper localization of interference sources on the electronic assembly. They document the entire near-field image of the tested device. The scanner probes have shielded current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistor. The measurement signal can be amplified using the PA 203 or PA 303 preamplifier. Further scanner probes LFS, RFS, XFS, and SXS are available on request.

Technical Specifications

Frequency Range 30 MHz ... 3 GHz
Connector SMA, male, socket
Weniger
Weiterlesen
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