XF-E 09s POLI E 30 MHz probe up to 6 GHz
  • XF-E 09s POLI E 30 MHz probe up to 6 GHz

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Manufacturer: Langer EMV-Technik

XF-E 09s POLI E 30 MHz probe up to 6 GHz

The electrode on the probe head of the XF-E 09s near-field probe detects electrical fields which, for example are decoupled above the IC’s surface. The probe’s resolution allows for measurements at a distance of 0.5 mm upto 10 mm above an assembly. The XF-E 09s is a passive near-field probe. In principle it has the same structure as the XF-E 04s probe. To measure, the E-field probe is positioned above or onto components and printed circuit boards. It has a current attenuating sheath and, therefore, its upper half is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe has an internal terminating resistance.
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The electrode on the probe head of the XF-E 09s near-field probe detects electrical fields which, for example are decoupled above the IC’s surface. The probe’s resolution allows for measurements at a distance of 0.5 mm upto 10 mm above an assembly. The XF-E 09s is a passive near-field probe. In principle it has the same structure as the XF-E 04s probe. To measure, the E-field probe is positioned above or onto components and printed circuit boards. It has a current attenuating sheath and, therefore, its upper half is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe has an internal terminating resistance.
Less
Read more
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