RF-E 09 Poll E 30 MHz up to 3 GHz
  • RF-E 09 Poll E 30 MHz up to 3 GHz

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Manufacturer: Langer EMV-Technik

RF-E 09 Poll E 30 MHz up to 3 GHz

The electrode on the underside of RF-E 09 probe head detects electrical fields decoupled by ICs. The resolution of the probe enables measurements from distances of 0,5 to 10 mm above assemblies. The RF-E 09 probe was developed for Langer scanner. The RF-E 09 is a passive near-field probe. In principle it has the same structure as the RF-E 03 and RF-E 04 probes. With its small square electrode surface, the specific source of electrical interference field can be detected. For measurements, the E-field probe is held above or positioned onto components and printed circuit boards. The upper half of the probe is electrically shielded. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E field probe has an internal terminating resistance.

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The electrode on the underside of RF-E 09 probe head detects electrical fields decoupled by ICs. The resolution of the probe enables measurements from distances of 0,5 to 10 mm above assemblies. The RF-E 09 probe was developed for Langer scanner. The RF-E 09 is a passive near-field probe. In principle it has the same structure as the RF-E 03 and RF-E 04 probes. With its small square electrode surface, the specific source of electrical interference field can be detected. For measurements, the E-field probe is held above or positioned onto components and printed circuit boards. The upper half of the probe is electrically shielded. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E field probe has an internal terminating resistance.
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