FLS 106 IC set
  • FLS 106 IC set
  • FLS 106 IC set

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Manufacturer: Langer EMV-Technik

FLS 106 IC set

  • FLS 106 IC

FLS 106 IC set

IC Scanner 4-Axis Positioning System

Short description

The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly.

The ICR near-field probes allow for the measurement of high-frequency magnetic or E-fields up to 6 GHz with a high measuring resolution of 50 to 100 µm.

The IC scanner can be set up for surface scans and ESD or EFT immunity tests in a few simple steps.

Scope of delivery

1x FLS 106 IC, 4-Axis Positioning System
1x CS-Scanner, ChipScan-Scanner Software / USB
1x GND 25, Ground Plane
1x DM-CAM, Digital Microscope Camera
1x Rotary unit, Rotary Unit
1x DM-CAM holder.3, Microscope Camera Holder
1x FLS 106 IC acc, Accessories for scanner

Recommended products

ICR Probe, Your selection from our range of near-field microprobes
ICI 01 L-EFT set, IC EM Pulse Injection Langer Pulse
XF Product family, Near-Field Probes 30 MHz up to 6 GHz
SX1 set, Near-Field Probes 1 GHz up to 10 GHz
PA 306 SMA, Preamplifier 100 kHz up to 6 GHz
SH 01, Probe Holder for Langer scanner
UH DUT set, Universal Holder for Langer scanner

Technical parameters

Supply voltage 110 V / 230 V
Interface USB
Axes x, y, z; α
Max. traverse range (400 x 600 x 120) mm; α-Rotation ±180°
Min. step size (20 x 20 x 20) µm; α-Rotation 1°
Positioning speed (20 x 25 x 10) mm/s; α-Rotation 90°/s
Weight 75 kg
Sizes (L x W x H) (1030 x 775 x 900) mm

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FLS 106 IC set

IC Scanner 4-Axis Positioning System

Short description

The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly.

The ICR near-field probes allow for the measurement of high-frequency magnetic or E-fields up to 6 GHz with a high measuring resolution of 50 to 100 µm.

The IC scanner can be set up for surface scans and ESD or EFT immunity tests in a few simple steps.

Scope of delivery

1x FLS 106 IC, 4-Axis Positioning System
1x CS-Scanner, ChipScan-Scanner Software / USB
1x GND 25, Ground Plane
1x DM-CAM, Digital Microscope Camera
1x Rotary unit, Rotary Unit
1x DM-CAM holder.3, Microscope Camera Holder
1x FLS 106 IC acc, Accessories for scanner

Recommended products

ICR Probe, Your selection from our range of near-field microprobes
ICI 01 L-EFT set, IC EM Pulse Injection Langer Pulse
XF Product family, Near-Field Probes 30 MHz up to 6 GHz
SX1 set, Near-Field Probes 1 GHz up to 10 GHz
PA 306 SMA, Preamplifier 100 kHz up to 6 GHz
SH 01, Probe Holder for Langer scanner
UH DUT set, Universal Holder for Langer scanner

Technical parameters

Supply voltage 110 V / 230 V
Interface USB
Axes x, y, z; α
Max. traverse range (400 x 600 x 120) mm; α-Rotation ±180°
Min. step size (20 x 20 x 20) µm; α-Rotation 1°
Positioning speed (20 x 25 x 10) mm/s; α-Rotation 90°/s
Weight 75 kg
Sizes (L x W x H) (1030 x 775 x 900) mm
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