LFS-B 3 Scanner Probe 100 kHz up to 50 MHz
  • LFS-B 3 Scanner Probe 100 kHz up to 50 MHz
  • LFS-B 3 Scanner Probe 100 kHz up to 50 MHz
  • LFS-B 3 Scanner Probe 100 kHz up to 50 MHz

Photos are for informational purposes only. View product specification

please use latin characters

Manufacturer: Langer EMV-Technik

LFS-B 3 Scanner Probe 100 kHz up to 50 MHz

  • LFS-B 3

LFS-B 3 Scanner Probe 100 kHz up to 50 MHz

Short description

The measuring coil of the H-field probe LFS-B 3 sits orthogonally to the shaft. Using the probe tip perpendicularly ensures its correct placement directly on the assembly or device to be measured.
This allows for use at places on the surface of printed circuit boards typically hard to access, e.g. between large components of switching controllers.
The LFS-B 3 is a passive near-field probe for use in a scanner to measure magnetic field during development. The LFS-B 3 detects magnetic field lines emitted from the measured object at 90°. Magnetic field lines which enter the probe laterally are not detected. The near-field probe is small and handy. It has a current attenuating sheath and is, therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

Technical parameters

Frequency range 100 kHz ... 50 MHz
Resolution ≈ 2 mm
Probe head dimensions Ø ≈ 4 mm
Connector - output SMA, male, jack

Send an inquiry

Are you interested in this product? Do you need additional information or individual pricing?

Contact us
ASK FOR THE PRODUCT close
Thank you for sending your message. We will respond as soon as possible.
ASK FOR THE PRODUCT close
Browse

Add to Wishlist

You must be logged in

LFS-B 3 Scanner Probe 100 kHz up to 50 MHz

Short description

The measuring coil of the H-field probe LFS-B 3 sits orthogonally to the shaft. Using the probe tip perpendicularly ensures its correct placement directly on the assembly or device to be measured.
This allows for use at places on the surface of printed circuit boards typically hard to access, e.g. between large components of switching controllers.
The LFS-B 3 is a passive near-field probe for use in a scanner to measure magnetic field during development. The LFS-B 3 detects magnetic field lines emitted from the measured object at 90°. Magnetic field lines which enter the probe laterally are not detected. The near-field probe is small and handy. It has a current attenuating sheath and is, therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

Technical parameters

Frequency range 100 kHz ... 50 MHz
Resolution ≈ 2 mm
Probe head dimensions Ø ≈ 4 mm
Connector - output SMA, male, jack
Comments (0)