Scanner Probe RFS-E 03 30 MHz up to 3 GHz
  • Scanner Probe RFS-E 03 30 MHz up to 3 GHz
  • Scanner Probe RFS-E 03 30 MHz up to 3 GHz

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Manufacturer: Langer EMV-Technik

Scanner Probe RFS-E 03 30 MHz up to 3 GHz

  • RFS-E 03

Scanner Probe RFS-E 03 30 MHz up to 3 GHz

Description

Using the approx. 4x4 mm electrode, which is located in the bottom of the RFS-E 03 probe head, E-fields from clocked lines, IC pins, and smaller components can be detected.

The RFS-E 03 is a passive near-field scanner probe. For measurements the E-field probe is positioned above the components or areas of the PC board. The near-field probe has a sheath current attenuation and is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe does not have a 50 Ω terminating resistor internally.

Technical parameters

Frequency range 30 MHz ... 3 GHz
Probe head dimensions ≈ (4 x 4) mm
Connector - output SMA, male, plug
Length ≈ 55 mm

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Scanner Probe RFS-E 03 30 MHz up to 3 GHz

Description

Using the approx. 4x4 mm electrode, which is located in the bottom of the RFS-E 03 probe head, E-fields from clocked lines, IC pins, and smaller components can be detected.

The RFS-E 03 is a passive near-field scanner probe. For measurements the E-field probe is positioned above the components or areas of the PC board. The near-field probe has a sheath current attenuation and is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe does not have a 50 Ω terminating resistor internally.

Technical parameters

Frequency range 30 MHz ... 3 GHz
Probe head dimensions ≈ (4 x 4) mm
Connector - output SMA, male, plug
Length ≈ 55 mm
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