Scanner Probe RFS-R 3-2 30 MHz up to 3 GHz
Scanner Probe RFS-R 3-2 30 MHz up to 3 GHz
Scanner Probe RFS-R 3-2 30 MHz up to 3 GHz

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Manufacturer: Langer EMV-Technik

Scanner Probe RFS-R 3-2 30 MHz up to 3 GHz

  • RFS-R 3-2

Scanner Probe RFS-R 3-2 30 MHz up to 3 GHz

Description

The RFS-R 3-2 scanner probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components.

The RFS-R 3-2 is a passive near-field probe. The H-field probe is designed to be used very close to the components and where high magnetic field strength occurs. It has a current attenuating sheath and, therefore, is electrically shielded. The magnetic field scanner probe can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

Technical parameters

Frequency range 30 MHz ... 3 GHz
Resolution ≈ 1 mm
Probe head dimensions Ø ≈ 3 mm
Connector - output SMA, male, jack
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Scanner Probe RFS-R 3-2 30 MHz up to 3 GHz

Description

The RFS-R 3-2 scanner probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components.

The RFS-R 3-2 is a passive near-field probe. The H-field probe is designed to be used very close to the components and where high magnetic field strength occurs. It has a current attenuating sheath and, therefore, is electrically shielded. The magnetic field scanner probe can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

Technical parameters

Frequency range 30 MHz ... 3 GHz
Resolution ≈ 1 mm
Probe head dimensions Ø ≈ 3 mm
Connector - output SMA, male, jack
Less
Read more
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