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Scanner Probe RFS-R 50 30 MHz up to 3 GHz
Description
The RFS-R 50 H-field probe is designed for taking field measurements on assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can be used to identify larger components as sources of interference.
The RFS-R 50 is a passive near-field probe. It has a sheath current attenuation and is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. It does not have an internal terminating resistance.
Technical parameters
Frequency range | 30 MHz ... 3 GHz |
Probe head dimensions | Ø 10 mm |
Connector - output | SMA, male, plug |
Length | ≈ 55 mm |
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Scanner Probe RFS-R 50 30 MHz up to 3 GHz
Description
The RFS-R 50 H-field probe is designed for taking field measurements on assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can be used to identify larger components as sources of interference.
The RFS-R 50 is a passive near-field probe. It has a sheath current attenuation and is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. It does not have an internal terminating resistance.
Technical parameters
Frequency range | 30 MHz ... 3 GHz |
Probe head dimensions | Ø 10 mm |
Connector - output | SMA, male, plug |
Length | ≈ 55 mm |
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