ACNL-1 diode and thyristor tester
  • ACNL-1 diode and thyristor tester

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Manufacturer: DACPOL SERVICE

ACNL-1 diode and thyristor tester

ACNL-1 diode and thyristor tester

Diodes and thyristors tester VRRM/DRM to 7.5kV, IFM/TM to 5kA, dv/dt to 4000 V/µs.


Description

The tester is designed to check basic electrical parameters of power diodes and thyristors.

The tester is adapted for cooperation with an external press, a computer and a barcode reader. The external computer contains a database of test recipes, obtained test results and ensures cooperation with the barcode reader and the computer network.

Tests of diodes and thyristors are performed automatically after entering a test recipe. The test recipe is downloaded automatically from an external computer after the barcode is read or manually entered by the operator. The operator's actions are limited to operating the tester and press and do not have any influence on the test results.

The operation of the tester is controlled by an industrial computer equipped with measurement and control cards. The measurement card registers current and voltage waveforms and the computer evaluates them on the basis of the criteria included in the test recipe. Test results are displayed on the monitor screen in digital form and as graphics. The control card controls the operation of the tester's components. With the installed sensors, the computer monitors the work of these components and in case of irregularities displays an appropriate message about the type and location of the detected malfunction.

The tester computer software enables programming and execution of the test cycle, detects and locates defects, as well as enables individual control of each tester sub-assembly and verification of correct operation of the tester after the performed repair by the "step by step" method. The operator operates the tester using the computer touch screen, keyboard, mouse and control buttons and indicator lights.



The parameters of the tester allow to check:

    1. Voltage class with half wave sinusoidal voltage with amplitude in the range 200÷7500 V.
    2. Conduction voltage of half-wave forced sinusoidal voltage with amplitude up to 5000 V.
    3. Resistance of thyristors to du/dt effect forced by linearly increasing waveform with steepness from 300 V/µs to 4000 V/µs.


Technical data

Handling 1 person
Cycle period max. 15 s
Max. current consumption L1/L2 - 250 A in 20 ms; L3 - 5 A
Operator-tester communication Monitor touch screen, keyboard and mouse, indicator lights and control buttons
Form of communication Text messages to support the operator, digital measurement results, graphs of recorded waveforms, diagnostic messages to support the service
Types of tester software Diode and thyristor parameter testing, communication with external computer, service software
Service software Diode and thyristor parameter testing (step operation), scaling of tester modules, calibration of tester modules, individual control of tester subassemblies
Tasks performed by the tester computer Control of the tester's subassemblies, communication of the tester with an external computer, display of messages for the operator, display of diagnostic messages, display of test results
Module parameters for voltage class verification
Test voltage shape Half-wave sinusoidal voltage 10/8,3 ms
Voltage amplitude adjustment range VRRM/VDRM 0÷7500 V
Test voltage measurement tolerance 1%
Lockout/reverse current measurement range IRRM/IDRM 0÷600 mA
Current amplitude measurement tolerance 1%
Module parameters for measuring the conduction voltage
Shape of the test current Half-wave sinusoidal current 10/8,3 ms
Method of adjusting the test current amplitude IFM/ITM Autotransformer with motor
Current amplitude adjustment range IFM/ITM 0÷5000 A
Current amplitude measurement tolerance 3%
Conductive voltage measurement range 0÷10 V
Measurement tolerance of conduction voltage 1%
Adjustment range of the gate current of the thyristor under test 0÷2500 mA
Adjustment range of the gate pulse duration of the thyristor under test 0÷5 ms
Module parameters for testing resistance of thyristors to du/dt effect
Nature of the waveform du/dt linear
Range of du/dt steepness adjustment 200÷4000 V/µs
Range of du/dt waveform amplitude adjustment 500÷6000 V
Tolerance for steepness of rise of du/dt waveform ±10%
Mechanical parameters
Dimensions [D x W x H] 1480 x 885 x 2000 mm
Weight 920 kg
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ACNL-1 diode and thyristor tester

Diodes and thyristors tester VRRM/DRM to 7.5kV, IFM/TM to 5kA, dv/dt to 4000 V/µs.


Description

The tester is designed to check basic electrical parameters of power diodes and thyristors.

The tester is adapted for cooperation with an external press, a computer and a barcode reader. The external computer contains a database of test recipes, obtained test results and ensures cooperation with the barcode reader and the computer network.

Tests of diodes and thyristors are performed automatically after entering a test recipe. The test recipe is downloaded automatically from an external computer after the barcode is read or manually entered by the operator. The operator's actions are limited to operating the tester and press and do not have any influence on the test results.

The operation of the tester is controlled by an industrial computer equipped with measurement and control cards. The measurement card registers current and voltage waveforms and the computer evaluates them on the basis of the criteria included in the test recipe. Test results are displayed on the monitor screen in digital form and as graphics. The control card controls the operation of the tester's components. With the installed sensors, the computer monitors the work of these components and in case of irregularities displays an appropriate message about the type and location of the detected malfunction.

The tester computer software enables programming and execution of the test cycle, detects and locates defects, as well as enables individual control of each tester sub-assembly and verification of correct operation of the tester after the performed repair by the "step by step" method. The operator operates the tester using the computer touch screen, keyboard, mouse and control buttons and indicator lights.



The parameters of the tester allow to check:

    1. Voltage class with half wave sinusoidal voltage with amplitude in the range 200÷7500 V.
    2. Conduction voltage of half-wave forced sinusoidal voltage with amplitude up to 5000 V.
    3. Resistance of thyristors to du/dt effect forced by linearly increasing waveform with steepness from 300 V/µs to 4000 V/µs.


Technical data

Handling 1 person
Cycle period max. 15 s
Max. current consumption L1/L2 - 250 A in 20 ms; L3 - 5 A
Operator-tester communication Monitor touch screen, keyboard and mouse, indicator lights and control buttons
Form of communication Text messages to support the operator, digital measurement results, graphs of recorded waveforms, diagnostic messages to support the service
Types of tester software Diode and thyristor parameter testing, communication with external computer, service software
Service software Diode and thyristor parameter testing (step operation), scaling of tester modules, calibration of tester modules, individual control of tester subassemblies
Tasks performed by the tester computer Control of the tester's subassemblies, communication of the tester with an external computer, display of messages for the operator, display of diagnostic messages, display of test results
Module parameters for voltage class verification
Test voltage shape Half-wave sinusoidal voltage 10/8,3 ms
Voltage amplitude adjustment range VRRM/VDRM 0÷7500 V
Test voltage measurement tolerance 1%
Lockout/reverse current measurement range IRRM/IDRM 0÷600 mA
Current amplitude measurement tolerance 1%
Module parameters for measuring the conduction voltage
Shape of the test current Half-wave sinusoidal current 10/8,3 ms
Method of adjusting the test current amplitude IFM/ITM Autotransformer with motor
Current amplitude adjustment range IFM/ITM 0÷5000 A
Current amplitude measurement tolerance 3%
Conductive voltage measurement range 0÷10 V
Measurement tolerance of conduction voltage 1%
Adjustment range of the gate current of the thyristor under test 0÷2500 mA
Adjustment range of the gate pulse duration of the thyristor under test 0÷5 ms
Module parameters for testing resistance of thyristors to du/dt effect
Nature of the waveform du/dt linear
Range of du/dt steepness adjustment 200÷4000 V/µs
Range of du/dt waveform amplitude adjustment 500÷6000 V
Tolerance for steepness of rise of du/dt waveform ±10%
Mechanical parameters
Dimensions [D x W x H] 1480 x 885 x 2000 mm
Weight 920 kg
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