Scanner Probe XFS-R 3-1 30 MHz up to 6 GHz
  • Scanner Probe XFS-R 3-1 30 MHz up to 6 GHz
  • Scanner Probe XFS-R 3-1 30 MHz up to 6 GHz

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Manufacturer: Langer EMV-Technik

Scanner Probe XFS-R 3-1 30 MHz up to 6 GHz

  • XFS-R 3-1

Scanner Probe XFS-R 3-1 30 MHz up to 6 GHz

Description

The XFS-R 3-1 scanner probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.

The XFS-R 3-1 H-field scanner probe is suitable for measurements close to the components with high magnetic field strength. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.

Technical parameters

Frequency range 30 MHz ... 6 GHz
Resolution ≈ 1 mm
Probe head dimensions Ø ≈ 3 mm
Connector - output SMA, male, jack
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Scanner Probe XFS-R 3-1 30 MHz up to 6 GHz

Description

The XFS-R 3-1 scanner probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.

The XFS-R 3-1 H-field scanner probe is suitable for measurements close to the components with high magnetic field strength. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.

Technical parameters

Frequency range 30 MHz ... 6 GHz
Resolution ≈ 1 mm
Probe head dimensions Ø ≈ 3 mm
Connector - output SMA, male, jack
Less
Read more
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