Kit de prueba de inmunidad E1
  • Kit de prueba de inmunidad E1
  • Kit de prueba de inmunidad E1
  • Kit de prueba de inmunidad E1
  • Kit de prueba de inmunidad E1
  • Kit de prueba de inmunidad E1

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Fabricante: Langer EMV-Technik

Kit de prueba de inmunidad E1

The E1 is a set of EMC tools used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken. The E1 test set-up is small and fits easily on a developer’s desk. The E1 set user manual describes EMC mechanisms and provides detailed descriptions of basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator to generate burst and ESD disturbances.

Scope of delivery

  • 1x SGZ 21, Burst Generator
  • 1x S21, Optical Sensor (10 Mbps)
  • 1x BS 02, Magnetic Field Source
  • 1x BS 04DB, Magnetic Field Source
  • 1x BS 05D, Magnetic Field Source
  • 1x BS 05DU, Magnetic Field Source
  • 1x ES 00, E-Field Source
  • 1x ES 01, E-Field Source
  • 1x ES 02, E-Field Source
  • 1x ES 05D, E-Field Source
  • 1x ES 08D, E-Field Source
  • 1x MS 02, Magnetic Field Probe
  • 1x E1 acc, Accessories
  • 1x NT FRI EU, Power Supply Unit
  • 1x E1 case, System Case
  • 1x E1 m, E1 Set User Manual

Technical parameters

S21 optical sensor
Transmission range DC...10 Mbps
Optical fibre connector 2.2 mm Ø
Supply voltage (3-5) V
Current input 10 mA
SGZ 21 burst Generator
Pulse parameter
Rise time ca. 2 ns
Tail time ca. 10 ns
Peak values ca. 0...1500 V
Optical input
Optical fiber 2.2 mm
Max. frequency 5 MHz
Min. pulse width 100 ns
Supply voltage 12 V / 200 mA
Sizes (L x W x H) (154 x 100 x 62) mm
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The E1 is a set of EMC tools used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken. The E1 test set-up is small and fits easily on a developer’s desk. The E1 set user manual describes EMC mechanisms and provides detailed descriptions of basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator to generate burst and ESD disturbances.

Scope of delivery

  • 1x SGZ 21, Burst Generator
  • 1x S21, Optical Sensor (10 Mbps)
  • 1x BS 02, Magnetic Field Source
  • 1x BS 04DB, Magnetic Field Source
  • 1x BS 05D, Magnetic Field Source
  • 1x BS 05DU, Magnetic Field Source
  • 1x ES 00, E-Field Source
  • 1x ES 01, E-Field Source
  • 1x ES 02, E-Field Source
  • 1x ES 05D, E-Field Source
  • 1x ES 08D, E-Field Source
  • 1x MS 02, Magnetic Field Probe
  • 1x E1 acc, Accessories
  • 1x NT FRI EU, Power Supply Unit
  • 1x E1 case, System Case
  • 1x E1 m, E1 Set User Manual

Technical parameters

S21 optical sensor
Transmission range DC...10 Mbps
Optical fibre connector 2.2 mm Ø
Supply voltage (3-5) V
Current input 10 mA
SGZ 21 burst Generator
Pulse parameter
Rise time ca. 2 ns
Tail time ca. 10 ns
Peak values ca. 0...1500 V
Optical input
Optical fiber 2.2 mm
Max. frequency 5 MHz
Min. pulse width 100 ns
Supply voltage 12 V / 200 mA
Sizes (L x W x H) (154 x 100 x 62) mm
Menos
Lee mas
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