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The Japanese IR-CZ series pyrometer is a stationary device for remote measurement of the temperature of a surface under observation. It is characterized by high accuracy and long-term measurement stability. In this series, the resolution for low temperatures has also been improved. The device is equipped with a temperature display and an analog output for the measured value. Optionally, it can be equipped with an analog input for remote emissivity adjustment and a laser target to facilitate user alignment.
Depending on the model, users can choose from various measurement ranges:
Symbol | Measurement Range |
---|---|
IR-CZP2N | 150~1400℃ |
IR-CZI2N | 300~1600℃ |
IR-CZS2N | 600~3000℃ |
IR-CZH7N | 900~3500℃ |
IR-CZQ2N | 400~2000℃ |
Technical Specifications:
Model | IR-CZP | IR-CZI | IR_CZS |
---|---|---|---|
Detector | InGaAs | InGaAs | Si |
Wavelength | 2µm | 1.55µm | 0.9µm |
Temperature Measurement Range | 80..1000°C (50) 150..1400°C (200) 200..1400°C (300) |
200..1000°C (50) 300..1600°C (200,300) 400..2000°C (200,300) |
450..2000°C (50) 600..3000°C (200,300) 700..3500°C (200,300) |
Accuracy | Below 500°C: ±3°C 500 to 1000°C: ±5°C Above 1000°C: ±0.5% of measured value |
Below 1000°C: ±5°C 1000 to 1500°C: ±0.5% of measured value Above 1500°C: ±0.6% of measured value |
Below 1000°C: ±5°C 1000 to 1500°C: ±0.5% of measured value 1500 to 2000°C: ±0.6% of measured value Above 2500°C: ±1% of measured value |
Repeatability | 0.2°C | 0.2°C | 0.2°C |
Resolution | 0.5°C | 0.5°C | 0.5°C |
Response Time | 3 ms | 3 ms | 3 ms |
Factor | 50, 200, 300 | 50, 200, 300 | 50, 200, 300 |
Target | Optical or laser (optional) | Optical or laser (optional) | Optical or laser (optional) |
Lens Diameter | Ø20 mm | Ø10 mm or Ø20 mm | Ø10 mm or Ø20 mm |
Operating Temperature | 0..50°C | -10..60°C | -10..60°C |
Power Consumption | Max. 3.3VA | Max. 3.3VA | Max. 3.3VA |
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The Japanese IR-CZ series pyrometer is a stationary device for remote measurement of the temperature of a surface under observation. It is characterized by high accuracy and long-term measurement stability. In this series, the resolution for low temperatures has also been improved. The device is equipped with a temperature display and an analog output for the measured value. Optionally, it can be equipped with an analog input for remote emissivity adjustment and a laser target to facilitate user alignment.
Depending on the model, users can choose from various measurement ranges:
Symbol | Measurement Range |
---|---|
IR-CZP2N | 150~1400℃ |
IR-CZI2N | 300~1600℃ |
IR-CZS2N | 600~3000℃ |
IR-CZH7N | 900~3500℃ |
IR-CZQ2N | 400~2000℃ |
Technical Specifications:
Model | IR-CZP | IR-CZI | IR_CZS |
---|---|---|---|
Detector | InGaAs | InGaAs | Si |
Wavelength | 2µm | 1.55µm | 0.9µm |
Temperature Measurement Range | 80..1000°C (50) 150..1400°C (200) 200..1400°C (300) |
200..1000°C (50) 300..1600°C (200,300) 400..2000°C (200,300) |
450..2000°C (50) 600..3000°C (200,300) 700..3500°C (200,300) |
Accuracy | Below 500°C: ±3°C 500 to 1000°C: ±5°C Above 1000°C: ±0.5% of measured value |
Below 1000°C: ±5°C 1000 to 1500°C: ±0.5% of measured value Above 1500°C: ±0.6% of measured value |
Below 1000°C: ±5°C 1000 to 1500°C: ±0.5% of measured value 1500 to 2000°C: ±0.6% of measured value Above 2500°C: ±1% of measured value |
Repeatability | 0.2°C | 0.2°C | 0.2°C |
Resolution | 0.5°C | 0.5°C | 0.5°C |
Response Time | 3 ms | 3 ms | 3 ms |
Factor | 50, 200, 300 | 50, 200, 300 | 50, 200, 300 |
Target | Optical or laser (optional) | Optical or laser (optional) | Optical or laser (optional) |
Lens Diameter | Ø20 mm | Ø10 mm or Ø20 mm | Ø10 mm or Ø20 mm |
Operating Temperature | 0..50°C | -10..60°C | -10..60°C |
Power Consumption | Max. 3.3VA | Max. 3.3VA | Max. 3.3VA |
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